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High ESD or IEC 61000-4-2 robustness
EOS protection characterization using Long-Pulse TLP
Building a Sustainable Future: Sofics and ONiO Collaborate on Battery-Free Devices
New opportunities for automotive LIN interfaces
Optimized on-chip ESD protection to enable high-speed Ethernet in cars.
ESD clamps for high voltage, BCD processes
Applying System level ESD (IEC 61000-4-2) stress on ICs
Challenges for IC design in medical applications
Local ESD protection in analog IOs
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