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ESD testing
EOS protection characterization using Long-Pulse TLP
3 approaches to handle EOS ‘requirements’
Time to say farewell to the snapback ggNMOS for ESD protection
ESD protection for Internet-of-Things (IoT)
Applying System level ESD (IEC 61000-4-2) stress on ICs
Transmission Line Pulse (TLP) test system
CDM robustness of SCR protection devices
ESD protection of interfaces with thin gate oxide transistors
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