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CDM
Applying System level ESD (IEC 61000-4-2) stress on ICs
Transmission Line Pulse (TLP) test system
CDM robustness of SCR protection devices
Solving the problems with traditional Silicon Controlled Rectifier (SCR) approaches for ESD
Characterizing the Transient Device Behavior of SCRs by means of VFTLP Waveform Analysis
Using the Voltage and Current Waveforms from VFTLP systems to study transient device behavior
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