ESD clamps for high voltage, BCD processes

Some applications really need high voltage interfaces and circuits. Think about power management and power conversion chips, automotive electronics for engine control, LCD or OLED display driver chips, motor driver electronics and industrial applications. These high voltage applications require other ESD protection clamps compared to the clamps used for protection of low voltage circuits.

Sofics has been involved in a number of chip projects that require custom ESD clamps for high voltage interfaces.

Optimized IP for GF’s 22nm FDX technology

The 22nm FDX process from GlobalFoundries is a great technology for various applications including low-power IoT on the edge, high-bandwidth 5G mmWave devices and automotive products, Since its market introduction, the SOI process technology receives a lot of attention because it combines unique features in one platform. At the 2021 GTC event, GlobalFoundries said thatContinue reading “Optimized IP for GF’s 22nm FDX technology”

Optimized Local I/O ESD Protection for SerDes In Advanced SOI, BiCMOS and FinFET Technology

Semiconductor companies are developing ever faster interfaces to satisfy the need for higher data throughputs. However, the parasitic capacitance of the traditional ESD solutions limits the signal frequency. This paper demonstrates low-cap Analog I/Os for high speed SerDes (28Gbps to 112Gbps) circuits created in advanced BiCMOS, SOI and FinFET nodes.

ESD protection for 8.5 GHz LNA in 90nm

This article provides information about an SCR based ESD protection clamp for RF circuits validated in TSMC 90nm CMOS technology. The ESD protection clamp described has excellent figures of merit: Due to the low parasitic capacitance, low leakage and high Q-factor the influence on the RF performance is limited.

Transmission Line Pulse (TLP) test system

To prevent failures during production, assembly and test, IC designers include on-chip Electrostatic Discharge (ESD) protection structures at the interfaces of their Integrated Circuits. This article discusses the main measurement technique, used by ESD experts to characterize ESD protection structures as well as the intrinsic process technology robustness or weakness.

Comparing 22nm CMOS, 22nm SOI and 16nm FinFET technology (part 2)

IC designers that develop a new integrated circuit have many different foundry and process options. There are several aspects that need to be considered to make a rational decision and select the optimal process. One of those items is on-chip Electrostatic Discharge (ESD) protection. This article compares the properties of the major ESD device types for 3 process options: CMOS (22nm), thin-film FD-SOI (22nm) and first generation FinFET (16nm) technology.

Comparing 22nm CMOS, 22nm SOI and 16nm FinFET technology (part 1)

IC designers that develop a new integrated circuit have many different foundry and process options. There are several aspects that need to be considered to make a rational decision and select the optimal process. One of those items is on-chip Electrostatic Discharge (ESD) protection. This article compares the properties of the major ESD device types for 3 process options: CMOS (22nm), thin-film FD-SOI (22nm) and first generation FinFET (16nm) technology.