Sofics’ 2021 IEDS publication.
Semiconductor companies are developing ever faster interfaces to satisfy the need for higher data throughputs. However, the parasitic capacitance of the traditional ESD solutions limits the signal frequency. This paper demonstrates low-cap Analog I/Os for high speed SerDes (28Gbps to 112Gbps) circuits created in advanced BiCMOS, SOI and FinFET nodes.
Category Archives: CMOS
Selecting optimized ESD protection for CMOS image sensors
Today, you can find CMOS image sensors almost everywhere in consumer, automotive, health and security applications. There has been a lot of innovation to enable demanding requirements.
The article provides a summary about the 3 main aspects that IC designers need to consider when selecting the ESD protection clamps for their image sensor projects.
3 approaches to handle EOS ‘requirements’
EOS, or Electrical Overstress, is any electrical stress that exceeds any of the specified absolute maximum ratings (AMR) of a product.
It is important to discuss because many products are damaged this way.
This article includes case studies and 3 approaches to handle those requests.
Optimized on-chip ESD protection to enable high-speed Ethernet in cars.
In the past most Electronic Control Units (ECU) used CAN and LIN interfaces to connect to sensors, actuators and each other. However, the newest applications need (much) faster communication options. Gigabit automotive ethernet is pushed by many in the industry as the perfect solution.
With its local ESD clamp approach, Sofics provides the best solution to protect those high-speed chip interfaces against Electrostatic Discharge events.
Time to say farewell to the snapback ggNMOS for ESD protection
For many years, IC designers coult count on the snapback behaviour of the ggNMOS device for ESD protection in mature CMOS nodes (180nm and below).
However, for more advanced CMOS, FinFET, SOI and high voltage processes there are serious drawbacks.
ESD protection solutions for space applications
Space applications require custom I/O and ESD protection solutions. Sofics proprietary ESD technology has been used for a number of aerospace projects. Our engineers delivered custom rad-hard ESD devices for TSMC 28nm, 65nm and 130nm CMOS technologies. The cells enable low power design in an extended temperature range. Different concepts are used to enable cold-spare interfaces. Low voltage triggered solutions are available for protection of thin oxide interface circuits.
ESD protection for Internet-of-Things (IoT)
What is the right ESD requirement for IoT applications? The internet of Things circuits are used in new environments. It is not possible to use the same reliability approaches for all the different applications. Sofics’ CEO Koen Verhaege presented an overview and different cases.
ESD protection for 8.5 GHz LNA in 90nm
This article provides information about an SCR based ESD protection clamp for RF circuits validated in TSMC 90nm CMOS technology. The ESD protection clamp described has excellent figures of merit: Due to the low parasitic capacitance, low leakage and high Q-factor the influence on the RF performance is limited.
Protection of CMOS output drivers
Every computer chip needs on-chip ESD protection at its interfaces. Integrated circuits have different kinds of interfaces. This article discusses approaches to protect output drivers. This article compares different options for output drivers, focused on the NMOS transistor because that is the most sensitive part and is easily damaged during ESD stress.
Applying System level ESD (IEC 61000-4-2) stress on ICs
Despite the fact that IEC 61000-4-2 is a standard created for system level ESD stress it is frequently used for stand alone integrated circuits. The test approach for chips is not defined nor standardized for this requirement so it is important to have a discussion on the test conditions and acceptance criteria. This article outlines 3 aspects that need to be considered if on-chip ESD protection needs to withstand the IEC 61000-4-2 stress
SOFICS - Solutions for ICs 